KMID : 0381919990290020255
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Korean Journal of Microscopy 1999 Volume.29 No. 2 p.255 ~ p.263
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Interfacial Reactions of Co/Ti Multilayer System
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Lee Sang-Hoon
Park Se-Jun Ko Dae-Hong
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Abstract
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We have investigated the interfacial reactions in Co/Ti multilayer thin films prepared by DC Magnetron sputtering system. We observed that the amorphous Co-Ti phase formed by SSAR (Solid State Amorphization Reaction) upon annealing at $200^{\circ}C$. Upon annealing treatments at $300^{\circ}C\;and\;400^{\circ}C$, a crystalline phase of CoTi formed at the Co/Ti interface. The sheet resistance of Co/Ti multilayer thin film increased by the formation of the amorphous phase at the Co/Ti interface, which decreased by the formation of new crystalline compound CoTi.
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KEYWORD
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Multilayer, SSAR, Interfacial reaction, Microstructure
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